loading...
Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1188257March/April 2003 (vol. 20 no. 2) pp. 8-18
 This Article 
 
Buy PURCHASE ARTICLE: $19
PDF
HTML
Buy IEEE Xplore Subscribers
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
ASCII Text
x 
 
Erik Jan Marinissen, Bart Vermeulen, Henk Hollmann, R.G.(Ben) Bennetts, "Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint," IEEE Design and Test of Computers, vol. 20, no. 2, pp. 8-18, March/April, 2003.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2003.1188257,
author = {Erik Jan Marinissen and Bart Vermeulen and Henk Hollmann and R.G.(Ben) Bennetts},
title = {Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint},
journal ={IEEE Design and Test of Computers},
volume = {20},
number = {2},
issn = {0740-7475},
year = {2003},
pages = {8-18},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1188257},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint
IS - 2
SN - 0740-7475
SP8
EP18
EPD - 8-18
A1 - Erik Jan Marinissen,
A1 - Bart Vermeulen,
A1 - Henk Hollmann,
A1 - R.G.(Ben) Bennetts,
PY - 2003
VL - 20
JA - IEEE Design and Test of Computers
ER -
 
Erik Jan Marinissen, Philips Research Laboratories
Bart Vermeulen, Philips Research Laboratories
Henk Hollmann, Philips Research Laboratories
R.G.(Ben) Bennetts, Bennetts Associates

Editor?s note:

When testing the interconnect structures on a board, test programmers sometimes ask, How can I control the test pattern generation process to avoid ground bounce problems during Extest mode? Those wishing to satisfy a simultaneously-switching-outputs constraint will find several new solutions in this article.
--Monica Lobetti-Bodoni
Siemens Mobile Communications

Citation:
Erik Jan Marinissen, Bart Vermeulen, Henk Hollmann, R.G.(Ben) Bennetts, "Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint," IEEE Design and Test of Computers, vol. 20, no. 2, pp. 8-18, Mar./Apr. 2003, doi:10.1109/MDT.2003.1188257
Usage of this product signifies your acceptance of the Terms of Use.