Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test

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http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1188260

March/April 2003 (vol. 20 no. 2) pp. 32-39

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	Uros Kac, Franc Novak, Florence Aza?, Pascal Nouet, Michel Renovell, "Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test," IEEE Design and Test of Computers, vol. 20, no. 2, pp. 32-39, March/April, 2003.

	BibTex	x
	@article{ 10.1109/MDT.2003.1188260, author = {Uros Kac and Franc Novak and Florence Aza? and Pascal Nouet and Michel Renovell}, title = {Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test}, journal ={IEEE Design and Test of Computers}, volume = {20}, number = {2}, issn = {0740-7475}, year = {2003}, pages = {32-39}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1188260}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test IS - 2 SN - 0740-7475 SP32 EP39 EPD - 32-39 A1 - Uros Kac, A1 - Franc Novak, A1 - Florence Aza?, A1 - Pascal Nouet, A1 - Michel Renovell, PY - 2003 VL - 20 JA - IEEE Design and Test of Computers ER -

Uros Kac, Jozef Stefan Institute

Franc Novak, Jozef Stefan Institute

Florence Aza?, LIRMM

Pascal Nouet, LIRMM

Michel Renovell, LIRMM

Editor?s note:

Will it or won?t it? The 1999 IEEE 1149.4 Standard for a Mixed-Signal Test Bus is on the cusp of industrial acceptance, but it?s not clear whether industry will pick it up. This study, by two leading European research institutes, delves into the details of hardware implementation and, in so doing, contributes to the growing literature on this topic.

--R.G. (Ben) Bennetts

Bennetts Associates

Citation:

Uros Kac, Franc Novak, Florence Aza?, Pascal Nouet, Michel Renovell, "Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test," IEEE Design and Test of Computers, vol. 20, no. 2, pp. 32-39, Mar./Apr. 2003, doi:10.1109/MDT.2003.1188260

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