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Online Self-Repair of FIR Filters
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1198686May/June 2003 (vol. 20 no. 3) pp. 50-57
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Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, "Online Self-Repair of FIR Filters," IEEE Design and Test of Computers, vol. 20, no. 3, pp. 50-57, May/June, 2003.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2003.1198686,
author = {Alfredo Benso and Stefano Di Carlo and Giorgio Di Natale and Paolo Prinetto},
title = {Online Self-Repair of FIR Filters},
journal ={IEEE Design and Test of Computers},
volume = {20},
number = {3},
issn = {0740-7475},
year = {2003},
pages = {50-57},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1198686},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Online Self-Repair of FIR Filters
IS - 3
SN - 0740-7475
SP50
EP57
EPD - 50-57
A1 - Alfredo Benso,
A1 - Stefano Di Carlo,
A1 - Giorgio Di Natale,
A1 - Paolo Prinetto,
PY - 2003
VL - 20
JA - IEEE Design and Test of Computers
ER -
 
Alfredo Benso, Politecnico di Torino
Stefano Di Carlo, Politecnico di Torino
Giorgio Di Natale, Politecnico di Torino
Paolo Prinetto, Politecnico di Torino

Editor?s note:

Chip-level failure detection has been a target of research for some time, but today?s very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today?s chips. This article introduces a self-repair solution for the digital FIR filter, one of the key blocks used in DSPs.
--Yervant Zorian, Virage Logic

Citation:
Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, "Online Self-Repair of FIR Filters," IEEE Design and Test of Computers, vol. 20, no. 3, pp. 50-57, May/June 2003, doi:10.1109/MDT.2003.1198686
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