Compacting Test Responses for Deeply Embedded SoC Cores

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http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1214349

July/August 2003 (vol. 20 no. 4) pp. 22-30

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	ASCII Text	x
	Ozgur Sinanoglu, Alex Orailoglu, "Compacting Test Responses for Deeply Embedded SoC Cores," IEEE Design and Test of Computers, vol. 20, no. 4, pp. 22-30, July/August, 2003.

	BibTex	x
	@article{ 10.1109/MDT.2003.1214349, author = {Ozgur Sinanoglu and Alex Orailoglu}, title = {Compacting Test Responses for Deeply Embedded SoC Cores}, journal ={IEEE Design and Test of Computers}, volume = {20}, number = {4}, issn = {0740-7475}, year = {2003}, pages = {22-30}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1214349}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Compacting Test Responses for Deeply Embedded SoC Cores IS - 4 SN - 0740-7475 SP22 EP30 EPD - 22-30 A1 - Ozgur Sinanoglu, A1 - Alex Orailoglu, PY - 2003 VL - 20 JA - IEEE Design and Test of Computers ER -

Ozgur Sinanoglu, University of California, San Diego

Alex Orailoglu, University of California, San Diego

Test bandwidth allocation issues greatly limit parallel testing of SoC cores. Here, the authors propose a response compaction methodology for reducing the required output core bandwidth, enabling increased parallelism among core tests and hence reducing overall SoC test time.

Citation:

Ozgur Sinanoglu, Alex Orailoglu, "Compacting Test Responses for Deeply Embedded SoC Cores," IEEE Design and Test of Computers, vol. 20, no. 4, pp. 22-30, July/Aug. 2003, doi:10.1109/MDT.2003.1214349

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