Seamless Test of Digital Components in Mixed-Signal Paths

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http://doi.ieeecomputersociety.org/10.1109/MDT.2004.1261849

January/February 2004 (vol. 21 no. 1) pp. 44-55

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	Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu, "Seamless Test of Digital Components in Mixed-Signal Paths," IEEE Design and Test of Computers, vol. 21, no. 1, pp. 44-55, January/February, 2004.

	BibTex	x
	@article{ 10.1109/MDT.2004.1261849, author = {Sule Ozev and Ismet Bayraktaroglu and Alex Orailoglu}, title = {Seamless Test of Digital Components in Mixed-Signal Paths}, journal ={IEEE Design and Test of Computers}, volume = {21}, number = {1}, issn = {0740-7475}, year = {2004}, pages = {44-55}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.1261849}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Seamless Test of Digital Components in Mixed-Signal Paths IS - 1 SN - 0740-7475 SP44 EP55 EPD - 44-55 A1 - Sule Ozev, A1 - Ismet Bayraktaroglu, A1 - Alex Orailoglu, PY - 2004 VL - 21 JA - IEEE Design and Test of Computers ER -

Sule Ozev, Duke University

Ismet Bayraktaroglu, Sun Microsystems

Alex Orailoglu, University of California, San Diego

For today's large, mixed-signal designs, test generation requires propagating signals through digital and analog modules. This article offers an innovative seamless approach that defines a digital test methodology for digital modules wherein the test inputs and responses can be propagated through a path containing analog signals.

Citation:

Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu, "Seamless Test of Digital Components in Mixed-Signal Paths," IEEE Design and Test of Computers, vol. 21, no. 1, pp. 44-55, Jan./Feb. 2004, doi:10.1109/MDT.2004.1261849

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