Measuring Architectural Vulnerability Factors

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http://doi.ieeecomputersociety.org/10.1109/MM.2003.1261389

November/December 2003 (vol. 23 no. 6) pp. 70-75

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	ASCII Text	x
	Shubhendu S. Mukherjee, Christopher T. Weaver, Joel Emer, Steven K. Reinhardt, Todd Austin, "Measuring Architectural Vulnerability Factors," IEEE Micro, vol. 23, no. 6, pp. 70-75, November/December, 2003.

	BibTex	x
	@article{ 10.1109/MM.2003.1261389, author = {Shubhendu S. Mukherjee and Christopher T. Weaver and Joel Emer and Steven K. Reinhardt and Todd Austin}, title = {Measuring Architectural Vulnerability Factors}, journal ={IEEE Micro}, volume = {23}, number = {6}, issn = {0272-1732}, year = {2003}, pages = {70-75}, doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2003.1261389}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Micro TI - Measuring Architectural Vulnerability Factors IS - 6 SN - 0272-1732 SP70 EP75 EPD - 70-75 A1 - Shubhendu S. Mukherjee, A1 - Christopher T. Weaver, A1 - Joel Emer, A1 - Steven K. Reinhardt, A1 - Todd Austin, PY - 2003 VL - 23 JA - IEEE Micro ER -

Shubhendu S. Mukherjee, Intel

Christopher T. Weaver, Intel, University of Michigan

Joel Emer, Intel

Steven K. Reinhardt, Intel, University of Michigan

Todd Austin, University of Michigan

Processor designers need accurate estimates of soft-error rates early in the design cycle to make appropriate cost-reliability tradeoffs. Here, the authors present a method for estimating the architectural vulnerability factor—the probability that a fault in a particular structure will result in an error.

Citation:

Shubhendu S. Mukherjee, Christopher T. Weaver, Joel Emer, Steven K. Reinhardt, Todd Austin, "Measuring Architectural Vulnerability Factors," IEEE Micro, vol. 23, no. 6, pp. 70-75, Nov./Dec. 2003, doi:10.1109/MM.2003.1261389

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