loading...
Specification Coverage Aided Test Selection
Guimar?es, Portugal June 18-June 20
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/CSD.2003.1207713Third International Conference on App ...
 This Article 
 
PDF
HTML
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Tuomo Pyhälä, Helsinki University of Technology
Keijo Heljanko, Helsinki University of Technology
In this paper test selection strategies in formal conformance testing are considered. As the testing conformance relation we use the ioco relation, and extend the previously presented on-the-fly test generation algorithms for ioco to include test selection heuristic based on a specification coverage metric. The proposed method combines a greedy test selection with randomization to guarantee completeness. As a novel implementation technique we employ bounded model checking for lookahead in greedy test selection.
Citation:
Tuomo Pyhälä, Keijo Heljanko, "Specification Coverage Aided Test Selection," acsd, pp.187, Third International Conference on Application of Concurrency to System Design (ACSD'03), 2003
Usage of this product signifies your acceptance of the Terms of Use.