H. Yoon, B. Choi, J.-O. Jeon,
"Mutation-Based Inter-Class Testing,"
Asia-Pacific Software Engineering Conference, pp. 174, Fifth Asia-Pacific Software Engineering Conference (APSEC'98), 1998.
BibTex
x
@article{
10.1109/APSEC.1998.733717, author = {H. Yoon and B. Choi and J.-O. Jeon}, title = {Mutation-Based Inter-Class Testing}, journal ={Asia-Pacific Software Engineering Conference}, volume = {0}, year = {1998}, isbn = {0-8186-9183-2}, pages = {174}, doi = {http://doi.ieeecomputersociety.org/10.1109/APSEC.1998.733717}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - Asia-Pacific Software Engineering Conference TI - Mutation-Based Inter-Class Testing SN - 0-8186-9183-2 SP EP A1 - H. Yoon, A1 - B. Choi, A1 - J.-O. Jeon, PY - 1998 VL - 0 JA - Asia-Pacific Software Engineering Conference ER -
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