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Predicting Fault Prone Modules by the Dempster-Shafer Belief Networks
Montreal, Quebec, Canada October 06-October 10
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ASE.2003.124031418th IEEE International Conference on ...
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Lan Guo, West Virginia University
Bojan Cukic, West Virginia University
Harshinder Singh, West Virginia University
This paper describes a novel methodology for predicting fault prone modules. The methodology is based on Dempster-Shafer (D-S) belief networks. Our approach consists of three steps: First, building the Dempster-Shafer network by the induction algorithm; Second, selecting the predictors (attributes) by the logistic procedure; Third, feeding the predictors describing the modules of the current project into the inducted Dempster-Shafer network and identifying fault prone modules. We applied this methodology to a NASA dataset. The prediction accuracy of our methodology is higher than that achieved by logistic regression or discriminant analysis on the same dataset.
Citation:
Lan Guo, Bojan Cukic, Harshinder Singh, "Predicting Fault Prone Modules by the Dempster-Shafer Belief Networks," ase, pp.249, 18th IEEE International Conference on Automated Software Engineering (ASE'03), 2003
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