Testing C-elements is not elementary

London, England May 30-May 31

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http://doi.ieeecomputersociety.org/10.1109/WCADM.1995.514652

Second Working Conference on Asynchro ...

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	J.A. Brzozowski, K. Raahemifar, "Testing C-elements is not elementary," Asynchronous Circuits and Systems, International Symposium on, pp. 150, Second Working Conference on Asynchronous Design Methodologies, 1995.

	BibTex	x
	@article{ 10.1109/WCADM.1995.514652, author = {J.A. Brzozowski and K. Raahemifar}, title = {Testing C-elements is not elementary}, journal ={Asynchronous Circuits and Systems, International Symposium on}, volume = {0}, year = {1995}, isbn = {0-8186-7098-3}, pages = {150}, doi = {http://doi.ieeecomputersociety.org/10.1109/WCADM.1995.514652}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asynchronous Circuits and Systems, International Symposium on TI - Testing C-elements is not elementary SN - 0-8186-7098-3 SP EP A1 - J.A. Brzozowski, A1 - K. Raahemifar, PY - 1995 KW - asynchronous circuits; logic testing; fault location; C-elements testing; stuck-at faults; gate circuits; C-element; logic tests; speed-independence; CMOS implementations VL - 0 JA - Asynchronous Circuits and Systems, International Symposium on ER -

J.A. Brzozowski, Dept. of Comput. Sci., Waterloo Univ., Ont., Canada

K. Raahemifar, Dept. of Comput. Sci., Waterloo Univ., Ont., Canada

We examine stuck-at faults in several gate circuits realizing the C-element. We exhibit circuits with the following phenomena: (a) 50% of single faults do not cause the circuit to halt. (b) Some faults are not detectable by logic tests. (c) A test of length seven is required to detect all detectable single faults. (d) A fault may result in an oscillation. (e) A fault may destroy the speed-independence of a circuit. We also analyze static and dynamic CMOS implementations of the C-element.

Index Terms:

asynchronous circuits; logic testing; fault location; C-elements testing; stuck-at faults; gate circuits; C-element; logic tests; speed-independence; CMOS implementations

Citation:

J.A. Brzozowski, K. Raahemifar, "Testing C-elements is not elementary," async, pp.150, Second Working Conference on Asynchronous Design Methodologies, 1995

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