Deterministic test generation for non-classical faults on the gate level

Bangalore, India November 23-November 24

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http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485343

Fourth Asian Test Symposium (ATS'95)

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	ASCII Text	x
	U. Mahlstedt, J. Alt, I. Hollenbeck, "Deterministic test generation for non-classical faults on the gate level," Asian Test Symposium, pp. 244, Fourth Asian Test Symposium (ATS'95), 1995.

	BibTex	x
	@article{ 10.1109/ATS.1995.485343, author = {U. Mahlstedt and J. Alt and I. Hollenbeck}, title = {Deterministic test generation for non-classical faults on the gate level}, journal ={Asian Test Symposium}, volume = {0}, year = {1995}, isbn = {0-8186-7129-7}, pages = {244}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485343}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Deterministic test generation for non-classical faults on the gate level SN - 0-8186-7129-7 SP EP A1 - U. Mahlstedt, A1 - J. Alt, A1 - I. Hollenbeck, PY - 1995 KW - combinational circuits; fault diagnosis; logic testing; logic CAD; design for testability; automatic test software; CMOS logic circuits; deterministic algorithms; deterministic test pattern generator; combinational circuits; CONTEST; gate level fault models; stuck-at faults; function conversions; bridging faults; transition faults; nonclassical faults; fault simulator; fault list generator; library-based fault modeling strategy; test efficiency; ISCAS benchmark circuits; algorithm; scan-based circuits; CMOS cell library; logic simulation; ATPG VL - 0 JA - Asian Test Symposium ER -

U. Mahlstedt, Inst. fur Theor. Elektrotech., Hannover Univ., Germany

J. Alt, Inst. fur Theor. Elektrotech., Hannover Univ., Germany

I. Hollenbeck, Inst. fur Theor. Elektrotech., Hannover Univ., Germany

This paper presents a deterministic test pattern generator for combinational circuits, called CONTEST, which can efficiently handle various gate level fault models: stuck-at faults, function conversions, bridging faults, transition faults and faults with additional fault detection conditions. CONTEST is part of a complete test generation system for non-classical faults which consists of a test pattern generator, a fault simulator and a fault list generator. The fault list generator uses a library-based fault modeling strategy which allows the specification of realistic target fault sets. Experimental results show that CONTEST can efficiently handle non-classical faults on the gate level. For a complex target fault set which encompasses for example stuck-at, stuck-open and bridging faults, a test efficiency of 100% has been achieved for each of the ISCAS benchmark circuits containing up to 38,000 nodes.

Index Terms:

combinational circuits; fault diagnosis; logic testing; logic CAD; design for testability; automatic test software; CMOS logic circuits; deterministic algorithms; deterministic test pattern generator; combinational circuits; CONTEST; gate level fault models; stuck-at faults; function conversions; bridging faults; transition faults; nonclassical faults; fault simulator; fault list generator; library-based fault modeling strategy; test efficiency; ISCAS benchmark circuits; algorithm; scan-based circuits; CMOS cell library; logic simulation; ATPG

Citation:

U. Mahlstedt, J. Alt, I. Hollenbeck, "Deterministic test generation for non-classical faults on the gate level," ats, pp.244, Fourth Asian Test Symposium (ATS'95), 1995

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