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Hierarchical Test Generation with Built-In Fault Diagnosis
Hsinchu, TAIWAN November 20-November 22
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1996.555130Fifth Asian Test Symposium (ATS'96)
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Dirk Stroobandt, Jan Van Campenhout, "Hierarchical Test Generation with Built-In Fault Diagnosis," Asian Test Symposium, pp. 22, Fifth Asian Test Symposium (ATS'96), 1996.
 
 
BibTex
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@article{ 10.1109/ATS.1996.555130,
author = {Dirk Stroobandt and Jan Van Campenhout},
title = {Hierarchical Test Generation with Built-In Fault Diagnosis},
journal ={Asian Test Symposium},
volume = {0},
year = {1996},
issn = {1081-7735},
pages = {22},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1996.555130},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Hierarchical Test Generation with Built-In Fault Diagnosis
SN - 1081-7735
SP
EP
A1 - Dirk Stroobandt,
A1 - Jan Van Campenhout,
PY - 1996
KW - Hierarchical Test Pattern Generation
KW - Fault Diagnosis
KW - Test Compaction.
VL - 0
JA - Asian Test Symposium
ER -
 
Dirk Stroobandt, University of Ghent
Jan Van Campenhout, University of Ghent
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from the start. An efficient test compaction method leads to a very compact test set, while retaining a maximum of diagnostic power and a 100% fault coverage for non-fanout circuits. An extension for fanout circuits is also presented.
Index Terms:
Hierarchical Test Pattern Generation, Fault Diagnosis, Test Compaction.
Citation:
Dirk Stroobandt, Jan Van Campenhout, "Hierarchical Test Generation with Built-In Fault Diagnosis," ats, pp.22, Fifth Asian Test Symposium (ATS'96), 1996
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