Hierarchical Testing Using the IEEE Std 1149.5 Module Test and Maintenance Slave Interface Module

Hsinchu, TAIWAN November 20-November 22

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http://doi.ieeecomputersociety.org/10.1109/ATS.1996.555136

Fifth Asian Test Symposium (ATS'96)

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	Jin-Hua Hong, Chung-Hung Tsai, Cheng-Wen Wu, "Hierarchical Testing Using the IEEE Std 1149.5 Module Test and Maintenance Slave Interface Module," Asian Test Symposium, pp. 50, Fifth Asian Test Symposium (ATS'96), 1996.

	BibTex	x
	@article{ 10.1109/ATS.1996.555136, author = {Jin-Hua Hong and Chung-Hung Tsai and Cheng-Wen Wu}, title = {Hierarchical Testing Using the IEEE Std 1149.5 Module Test and Maintenance Slave Interface Module}, journal ={Asian Test Symposium}, volume = {0}, year = {1996}, issn = {1081-7735}, pages = {50}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1996.555136}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Hierarchical Testing Using the IEEE Std 1149.5 Module Test and Maintenance Slave Interface Module SN - 1081-7735 SP EP A1 - Jin-Hua Hong, A1 - Chung-Hung Tsai, A1 - Cheng-Wen Wu, PY - 1996 KW - MTM Bus KW - Boundary Scan KW - Hierarchical Testing VL - 0 JA - Asian Test Symposium ER -

Jin-Hua Hong, National Tsing Hua University

Chung-Hung Tsai, National Tsing Hua University

Cheng-Wen Wu, National Tsing Hua University

An IEEE Std 1149.5 MTM-Bus Slave interface module is presented, which is used for direct access to 1149.1 chip-level buses and hierarchical test. All the standard 1149.1 functions, such as SAMPLE/PRELOAD, EXTEST, BYPASS, and even RUNBIST, can be performed within three 1149.5 Read/Write-Data message cycles. The messages are transmitted between the MTM-bus Master module (M-module) and the Slave module (S-module). We adopt the Full TAP Control (FTC) method to activate the 1149.1 Boundary-Scan paths via the 1149.5 MTM-Bus. A personal computer is used as the M-module.

Index Terms:

MTM Bus, Boundary Scan, Hierarchical Testing

Citation:

Jin-Hua Hong, Chung-Hung Tsai, Cheng-Wen Wu, "Hierarchical Testing Using the IEEE Std 1149.5 Module Test and Maintenance Slave Interface Module," ats, pp.50, Fifth Asian Test Symposium (ATS'96), 1996

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