Lessons Learned from Practical Applications of BIST/B-S Technology

Hsinchu, TAIWAN November 20-November 22

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http://doi.ieeecomputersociety.org/10.1109/ATS.1996.555167

Fifth Asian Test Symposium (ATS'96)

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	ASCII Text	x
	Najmi Jarwala, Paul W. Rutkowski, Shianling Wu, Chi Yau, "Lessons Learned from Practical Applications of BIST/B-S Technology," Asian Test Symposium, pp. 251, Fifth Asian Test Symposium (ATS'96), 1996.

	BibTex	x
	@article{ 10.1109/ATS.1996.555167, author = {Najmi Jarwala and Paul W. Rutkowski and Shianling Wu and Chi Yau}, title = {Lessons Learned from Practical Applications of BIST/B-S Technology}, journal ={Asian Test Symposium}, volume = {0}, year = {1996}, issn = {1081-7735}, pages = {251}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1996.555167}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Lessons Learned from Practical Applications of BIST/B-S Technology SN - 1081-7735 SP EP A1 - Najmi Jarwala, A1 - Paul W. Rutkowski, A1 - Shianling Wu, A1 - Chi Yau, PY - 1996 VL - 0 JA - Asian Test Symposium ER -

Najmi Jarwala, Lucent Technologies Bell Labs Innovations

Paul W. Rutkowski, Lucent Technologies Bell Labs Innovations

Shianling Wu, Lucent Technologies Bell Labs Innovations

Chi Yau, Lucent Technologies Bell Labs Innovations

Since Lucent Technologies (formerly AT&T) launched the Built-In Self-Test/Boundary-Scan (BIST/B-S) program in mid 1980's, over 200 devices and 80 circuit packs have incorporated BIST/B-S. These are from over 25 different project areas in various business units including Switching, Transmission, Wireless, Micro-Electronics, Federal Systems, and Consumer Products. Furthermore, since the early 1990's we have begun to see the full life-cycle impact of BIST and Boundary-Scan as a large quantity of hardware with BIST/B-S has gone full-cycle from design through manufacturing. We expect the steady growth in designs with BIST/B-S to continue and feel that the time is right to share our experiences and lessons learned from all levels: device, board, and system.

Citation:

Najmi Jarwala, Paul W. Rutkowski, Shianling Wu, Chi Yau, "Lessons Learned from Practical Applications of BIST/B-S Technology," ats, pp.251, Fifth Asian Test Symposium (ATS'96), 1996

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