Fault diagnosis of odd-even sorting networks

Akita, JAPAN November 17-November 18

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http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643972

Sixth Asian Test Symposium (ATS'97)

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	ASCII Text	x
	Chih Wei Hu, Chung Len Lee, Wen Ching Wu, J.E. Chen, "Fault diagnosis of odd-even sorting networks," Asian Test Symposium, pp. 288, Sixth Asian Test Symposium (ATS'97), 1997.

	BibTex	x
	@article{ 10.1109/ATS.1997.643972, author = {Chih Wei Hu and Chung Len Lee and Wen Ching Wu and J.E. Chen}, title = {Fault diagnosis of odd-even sorting networks}, journal ={Asian Test Symposium}, volume = {0}, year = {1997}, issn = {1081-7735}, pages = {288}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643972}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Fault diagnosis of odd-even sorting networks SN - 1081-7735 SP EP A1 - Chih Wei Hu, A1 - Chung Len Lee, A1 - Wen Ching Wu, A1 - J.E. Chen, PY - 1997 KW - fault diagnosis; odd-even sorting networks; fault diagnosis; location tests; sorting element faults; binary search procedures; ISDN; Banyan networks; switching system VL - 0 JA - Asian Test Symposium ER -

Chih Wei Hu, Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

Chung Len Lee, Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

Wen Ching Wu, Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

J.E. Chen, Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

This paper investigates detection and location for single faults in odd-even sorting networks. In the work, we have found that three tests are enough to locate single link fault and four tests are sufficient to detect single sorting element fault in an odd-even sorting network. For location tests for sorting element faults, the numbers of tests depend on the type of faults occurring at the sorting element. For most types of sorting element faults, the numbers are less than four specific tests. For the other types of faults, we have presented the test generation procedure and binary search procedures to generate the tests. The numbers of location tests are less than (n+log/sub 2/n), where n=log/sub 2/N and N is the number of inputs of the sorting network.

Index Terms:

fault diagnosis; odd-even sorting networks; fault diagnosis; location tests; sorting element faults; binary search procedures; ISDN; Banyan networks; switching system

Citation:

Chih Wei Hu, Chung Len Lee, Wen Ching Wu, J.E. Chen, "Fault diagnosis of odd-even sorting networks," ats, pp.288, Sixth Asian Test Symposium (ATS'97), 1997

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