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Configuring Arithmetic Pattern Generators and Response Compactors from the RT-Modules of a Circuit
Singapore December 02-December 04
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741571Seventh Asian Test Symposium (ATS'98)
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Frank Mayer, Albrecht P. Stroele, "Configuring Arithmetic Pattern Generators and Response Compactors from the RT-Modules of a Circuit," Asian Test Symposium, pp. 15, Seventh Asian Test Symposium (ATS'98), 1998.
 
 
BibTex
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@article{ 10.1109/ATS.1998.741571,
author = {Frank Mayer and Albrecht P. Stroele},
title = {Configuring Arithmetic Pattern Generators and Response Compactors from the RT-Modules of a Circuit},
journal ={Asian Test Symposium},
volume = {0},
year = {1998},
issn = {1081-7735},
pages = {15},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741571},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Asian Test Symposium
TI - Configuring Arithmetic Pattern Generators and Response Compactors from the RT-Modules of a Circuit
SN - 1081-7735
SP
EP
A1 - Frank Mayer,
A1 - Albrecht P. Stroele,
PY - 1998
VL - 0
JA - Asian Test Symposium
ER -
 
In recent years, accumulators have been shown to be efficient pattern generators and response compactors for built-in self-test. Many circuits contain modules which can be configured as accumulators just by controlling these modules adequately. This paper presents algorithms that find all possible accumulator configurations in a circuit and optimize the control of the accumulators for fast test application or inexpensive test control implementation.
Citation:
Frank Mayer, Albrecht P. Stroele, "Configuring Arithmetic Pattern Generators and Response Compactors from the RT-Modules of a Circuit," ats, pp.15, Seventh Asian Test Symposium (ATS'98), 1998
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