F. Vargas, E. Bezerra, L. Wulff, D. Barros, Jr.,
"Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems,"
Asian Test Symposium, pp. 52, Seventh Asian Test Symposium (ATS'98), 1998.
BibTex
x
@article{
10.1109/ATS.1998.741584, author = {F. Vargas and E. Bezerra and L. Wulff and D. Barros, Jr.}, title = {Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems}, journal ={Asian Test Symposium}, volume = {0}, year = {1998}, issn = {1081-7735}, pages = {52}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741584}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - Asian Test Symposium TI - Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems SN - 1081-7735 SP EP A1 - F. Vargas, A1 - E. Bezerra, A1 - L. Wulff, A1 - D. Barros, Jr., PY - 1998 VL - 0 JA - Asian Test Symposium ER -
F. Vargas, E. Bezerra, L. Wulff, D. Barros, Jr., "Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems," ats, pp.52, Seventh Asian Test Symposium (ATS'98), 1998
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