Y.-C. Hsu, S.K. Gupta,
"An Automatic Test Pattern Generator for At-Speed Robust Path Delay Testing,"
Asian Test Symposium, pp. 88, Seventh Asian Test Symposium (ATS'98), 1998.
BibTex
x
@article{
10.1109/ATS.1998.741595, author = {Y.-C. Hsu and S.K. Gupta}, title = {An Automatic Test Pattern Generator for At-Speed Robust Path Delay Testing}, journal ={Asian Test Symposium}, volume = {0}, year = {1998}, issn = {1081-7735}, pages = {88}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741595}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Asian Test Symposium TI - An Automatic Test Pattern Generator for At-Speed Robust Path Delay Testing SN - 1081-7735 SP EP A1 - Y.-C. Hsu, A1 - S.K. Gupta, PY - 1998 VL - 0 JA - Asian Test Symposium ER -
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