X. Wen, T. Honzawa, H. Tamamoto, K.K. Suluja, K. Kinoshita,
"Design for Diagnosability of CMOS Circuits,"
Asian Test Symposium, pp. 144, Seventh Asian Test Symposium (ATS'98), 1998.
BibTex
x
@article{
10.1109/ATS.1998.741605, author = {X. Wen and T. Honzawa and H. Tamamoto and K.K. Suluja and K. Kinoshita}, title = {Design for Diagnosability of CMOS Circuits}, journal ={Asian Test Symposium}, volume = {0}, year = {1998}, issn = {1081-7735}, pages = {144}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741605}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Asian Test Symposium TI - Design for Diagnosability of CMOS Circuits SN - 1081-7735 SP EP A1 - X. Wen, A1 - T. Honzawa, A1 - H. Tamamoto, A1 - K.K. Suluja, A1 - K. Kinoshita, PY - 1998 VL - 0 JA - Asian Test Symposium ER -
X. Wen, T. Honzawa, H. Tamamoto, K.K. Suluja, K. Kinoshita, "Design for Diagnosability of CMOS Circuits," ats, pp.144, Seventh Asian Test Symposium (ATS'98), 1998
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