M.G. Faust,
"ATE Features for IDDQ Testing,"
Asian Test Symposium, pp. 153, Seventh Asian Test Symposium (ATS'98), 1998.
BibTex
x
@article{
10.1109/ATS.1998.741607, author = {M.G. Faust}, title = {ATE Features for IDDQ Testing}, journal ={Asian Test Symposium}, volume = {0}, year = {1998}, issn = {1081-7735}, pages = {153}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741607}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - Asian Test Symposium TI - ATE Features for IDDQ Testing SN - 1081-7735 SP EP A1 - M.G. Faust, PY - 1998 VL - 0 JA - Asian Test Symposium ER -
PURCHASE ARTICLE: $19
IEEE Xplore Subscribers
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb