Satoshi Ohtake, Toshimitsu Masuzawa, Hideo Fujiwara,
"A Non-Scan DFT Method for Controllers to Achieve Complete Fault Efficiency,"
Asian Test Symposium, pp. 204, Seventh Asian Test Symposium (ATS'98), 1998.
BibTex
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@article{
10.1109/ATS.1998.741615, author = {Satoshi Ohtake and Toshimitsu Masuzawa and Hideo Fujiwara}, title = {A Non-Scan DFT Method for Controllers to Achieve Complete Fault Efficiency}, journal ={Asian Test Symposium}, volume = {0}, year = {1998}, issn = {1081-7735}, pages = {204}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741615}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Asian Test Symposium TI - A Non-Scan DFT Method for Controllers to Achieve Complete Fault Efficiency SN - 1081-7735 SP EP A1 - Satoshi Ohtake, A1 - Toshimitsu Masuzawa, A1 - Hideo Fujiwara, PY - 1998 VL - 0 JA - Asian Test Symposium ER -
Satoshi Ohtake, Toshimitsu Masuzawa, Hideo Fujiwara, "A Non-Scan DFT Method for Controllers to Achieve Complete Fault Efficiency," ats, pp.204, Seventh Asian Test Symposium (ATS'98), 1998
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