J.T. Van der Linden, M.H. Konijnenburg, A.J. van de Goor,
"Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection,"
Asian Test Symposium, pp. 212, Seventh Asian Test Symposium (ATS'98), 1998.
BibTex
x
@article{
10.1109/ATS.1998.741616, author = {J.T. Van der Linden and M.H. Konijnenburg and A.J. van de Goor}, title = {Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection}, journal ={Asian Test Symposium}, volume = {0}, year = {1998}, issn = {1081-7735}, pages = {212}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741616}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - Asian Test Symposium TI - Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection SN - 1081-7735 SP EP A1 - J.T. Van der Linden, A1 - M.H. Konijnenburg, A1 - A.J. van de Goor, PY - 1998 VL - 0 JA - Asian Test Symposium ER -
J.T. Van der Linden, M.H. Konijnenburg, A.J. van de Goor, "Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection," ats, pp.212, Seventh Asian Test Symposium (ATS'98), 1998
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