Y. Yu, J. Xu, W.K. Huang, F. Lombardi,
"A Diagnosis Method for Interconnects in SRAM Based FPGAs,"
Asian Test Symposium, pp. 278, Seventh Asian Test Symposium (ATS'98), 1998.
BibTex
x
@article{
10.1109/ATS.1998.741625, author = {Y. Yu and J. Xu and W.K. Huang and F. Lombardi}, title = {A Diagnosis Method for Interconnects in SRAM Based FPGAs}, journal ={Asian Test Symposium}, volume = {0}, year = {1998}, issn = {1081-7735}, pages = {278}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741625}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - Asian Test Symposium TI - A Diagnosis Method for Interconnects in SRAM Based FPGAs SN - 1081-7735 SP EP A1 - Y. Yu, A1 - J. Xu, A1 - W.K. Huang, A1 - F. Lombardi, PY - 1998 VL - 0 JA - Asian Test Symposium ER -
Y. Yu, J. Xu, W.K. Huang, F. Lombardi, "A Diagnosis Method for Interconnects in SRAM Based FPGAs," ats, pp.278, Seventh Asian Test Symposium (ATS'98), 1998
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