Y. Sameshima, T. Fukazawa,
"A DFT Methodology for High-Speed MCM Based on Boundary-Scan Techniques,"
Asian Test Symposium, pp. 521, Seventh Asian Test Symposium (ATS'98), 1998.
BibTex
x
@article{
10.1109/ATS.1998.1191704, author = {Y. Sameshima and T. Fukazawa}, title = {A DFT Methodology for High-Speed MCM Based on Boundary-Scan Techniques}, journal ={Asian Test Symposium}, volume = {0}, year = {1998}, issn = {1081-7735}, pages = {521}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.1191704}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Asian Test Symposium TI - A DFT Methodology for High-Speed MCM Based on Boundary-Scan Techniques SN - 1081-7735 SP EP A1 - Y. Sameshima, A1 - T. Fukazawa, PY - 1998 VL - 0 JA - Asian Test Symposium ER -
Y. Sameshima, T. Fukazawa, "A DFT Methodology for High-Speed MCM Based on Boundary-Scan Techniques," ats, pp.521, Seventh Asian Test Symposium (ATS'98), 1998
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