On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits

Shanghai, China November 16-November 18

DOI Bookmark:

http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810724

Eighth Asian Test Symposium (ATS'99)

	This Article
	PURCHASE ARTICLE: $19 PDF HTML IEEE Xplore Subscribers
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Seiji Kajihara Articles by Atsushi Murakami Articles by Tomohisa Kaneko

	ASCII Text	x
	Seiji Kajihara, Atsushi Murakami, Tomohisa Kaneko, "On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits," Asian Test Symposium, pp. 20, Eighth Asian Test Symposium (ATS'99), 1999.

	BibTex	x
	@article{ 10.1109/ATS.1999.810724, author = {Seiji Kajihara and Atsushi Murakami and Tomohisa Kaneko}, title = {On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits}, journal ={Asian Test Symposium}, volume = {0}, year = {1999}, issn = {1081-7735}, pages = {20}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810724}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits SN - 1081-7735 SP EP A1 - Seiji Kajihara, A1 - Atsushi Murakami, A1 - Tomohisa Kaneko, PY - 1999 VL - 0 JA - Asian Test Symposium ER -

Seiji Kajihara, Kyushu Institute of Technology

Atsushi Murakami, Kyushu Institute of Technology

Tomohisa Kaneko, Kyushu Institute of Technology

This paper investigates test sets with high fault cover-age for multiple stuck-at faults of large combinational cir-cuits and fully scanned sequential circuits. We show an ability of multiple fault detection of test sets generated for single stuck-at faults, then give a procedure for generating a compact test set with high multiple fault coverage. Re-sults show that our method can generate a test set with complete fault coverage for many circuits, and the size of the test set is smaller than previously reported ones.

Citation:

Seiji Kajihara, Atsushi Murakami, Tomohisa Kaneko, "On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits," ats, pp.20, Eighth Asian Test Symposium (ATS'99), 1999

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.