Defining SRAM Resistive Defects and Their Simulation Stimuli

Shanghai, China November 16-November 18

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http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810726

Eighth Asian Test Symposium (ATS'99)

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	ASCII Text	x
	A.J. van de Goor, J.E. Simonse, "Defining SRAM Resistive Defects and Their Simulation Stimuli," Asian Test Symposium, pp. 33, Eighth Asian Test Symposium (ATS'99), 1999.

	BibTex	x
	@article{ 10.1109/ATS.1999.810726, author = {A.J. van de Goor and J.E. Simonse}, title = {Defining SRAM Resistive Defects and Their Simulation Stimuli}, journal ={Asian Test Symposium}, volume = {0}, year = {1999}, issn = {1081-7735}, pages = {33}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810726}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Defining SRAM Resistive Defects and Their Simulation Stimuli SN - 1081-7735 SP EP A1 - A.J. van de Goor, A1 - J.E. Simonse, PY - 1999 KW - Resistive defects KW - SPICE simulation KW - simulation stimuli KW - SRAM functional faults VL - 0 JA - Asian Test Symposium ER -

A.J. van de Goor, Delft University of Technology

J.E. Simonse, Delft University of Technology

This paper presents a structured way of deriving new functional fault models, based on the insertion of resistive defects into the electrical schematic of an SRAM. A taxonomy of the set of possible electrical faults is given, a set of primitive patterns to drive the electrical level simulator is derived, the existing notation for functional faults is revisited, and simulation results prove the existence of new functional faults.

Index Terms:

Resistive defects, SPICE simulation, simulation stimuli, SRAM functional faults

Citation:

A.J. van de Goor, J.E. Simonse, "Defining SRAM Resistive Defects and Their Simulation Stimuli," ats, pp.33, Eighth Asian Test Symposium (ATS'99), 1999

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