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March Tests for Word-Oriented Two-Port Memories
Shanghai, China November 16-November 18
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810729Eighth Asian Test Symposium (ATS'99)
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Said Hamdioui, A. J. van de Goor, "March Tests for Word-Oriented Two-Port Memories," Asian Test Symposium, pp. 53, Eighth Asian Test Symposium (ATS'99), 1999.
 
 
BibTex
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@article{ 10.1109/ATS.1999.810729,
author = {Said Hamdioui and A. J. van de Goor},
title = {March Tests for Word-Oriented Two-Port Memories},
journal ={Asian Test Symposium},
volume = {0},
year = {1999},
issn = {1081-7735},
pages = {53},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810729},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Asian Test Symposium
TI - March Tests for Word-Oriented Two-Port Memories
SN - 1081-7735
SP
EP
A1 - Said Hamdioui,
A1 - A. J. van de Goor,
PY - 1999
VL - 0
JA - Asian Test Symposium
ER -
 
Said Hamdioui, Intel Corporation and Delft University of Technology
A. J. van de Goor, Delft University of Technology
This paper presents an approach for testing word- oriented multi-port memories. Fault models for such memories are given based on fault models for bit- oriented multi-port memories. A distinction between intra-word faults and inter-word faults is made. A systematic way of converting bit-oriented multi-port memory tests into word-oriented multi-port memory tests is presented.
Citation:
Said Hamdioui, A. J. van de Goor, "March Tests for Word-Oriented Two-Port Memories," ats, pp.53, Eighth Asian Test Symposium (ATS'99), 1999
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