An Evaluation of Test Generation Algorithms for combinational Circuits

Shanghai, China November 16-November 18

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http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810730

Eighth Asian Test Symposium (ATS'99)

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	ASCII Text	x
	Shiyi Xu, Tukwasibwe Justaf Frank, "An Evaluation of Test Generation Algorithms for combinational Circuits," Asian Test Symposium, pp. 63, Eighth Asian Test Symposium (ATS'99), 1999.

	BibTex	x
	@article{ 10.1109/ATS.1999.810730, author = {Shiyi Xu and Tukwasibwe Justaf Frank}, title = {An Evaluation of Test Generation Algorithms for combinational Circuits}, journal ={Asian Test Symposium}, volume = {0}, year = {1999}, issn = {1081-7735}, pages = {63}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810730}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - An Evaluation of Test Generation Algorithms for combinational Circuits SN - 1081-7735 SP EP A1 - Shiyi Xu, A1 - Tukwasibwe Justaf Frank, PY - 1999 KW - Testability KW - Genetic Algorithm KW - Forecasting KW - Test Generation VL - 0 JA - Asian Test Symposium ER -

Shiyi Xu, Shanghai University

Tukwasibwe Justaf Frank, Shanghai University

Within this era of VLSI circuits, testability is truly a very crucial issue. To generate a test set for a given circuit, choice of an algorithm within a number of existing test generation algorithms to apply is bound to vary from circuit to circuit. Some objective quantitative measures are used in making such choice. Such measures are so important to the analysis of algorithms that become the subject of this work.

Index Terms:

Testability, Genetic Algorithm, Forecasting, Test Generation

Citation:

Shiyi Xu, Tukwasibwe Justaf Frank, "An Evaluation of Test Generation Algorithms for combinational Circuits," ats, pp.63, Eighth Asian Test Symposium (ATS'99), 1999

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