On an Effective Selection of IDDQ Measurement Vectors for Sequential Circuits

Shanghai, China November 16-November 18

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http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810743

Eighth Asian Test Symposium (ATS'99)

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	ASCII Text	x
	Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara, "On an Effective Selection of IDDQ Measurement Vectors for Sequential Circuits," Asian Test Symposium, pp. 147, Eighth Asian Test Symposium (ATS'99), 1999.

	BibTex	x
	@article{ 10.1109/ATS.1999.810743, author = {Hideyuki Ichihara and Kozo Kinoshita and Seiji Kajihara}, title = {On an Effective Selection of IDDQ Measurement Vectors for Sequential Circuits}, journal ={Asian Test Symposium}, volume = {0}, year = {1999}, issn = {1081-7735}, pages = {147}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810743}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - On an Effective Selection of IDDQ Measurement Vectors for Sequential Circuits SN - 1081-7735 SP EP A1 - Hideyuki Ichihara, A1 - Kozo Kinoshita, A1 - Seiji Kajihara, PY - 1999 KW - IDDQ testing KW - test compaction VL - 0 JA - Asian Test Symposium ER -

Hideyuki Ichihara, Osaka University

Kozo Kinoshita, Osaka University

Seiji Kajihara, Kyushu Institute of Technology

IDDQ testing strongly requires to reduce the number of times of IDDQ measurements, because IDDQ measurement is time-consuming. Therefore it is important to select small number of IDDQ measurement vectors in a test sequence for a sequential circuit while fault coverage is nearly maximum. In this paper, we give a new selection problem of measurement vectors by introducing a cost function which is defined by the number of measurement vectors and fault coverage. The proposed method for selecting measurement vectors optimizes the cost function so that high fault coverage would be obtained by a small number of measurement vectors.

Index Terms:

IDDQ testing, test compaction

Citation:

Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara, "On an Effective Selection of IDDQ Measurement Vectors for Sequential Circuits," ats, pp.147, Eighth Asian Test Symposium (ATS'99), 1999

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