The search for tests for sequential circuits (STPG) by deterministic test pattern generation is a process of alternately performing mandatory assignments and heuristic decisions on signal lines. We have observed problems in the decision-making process due to shortcomings in the SCOAP controllability/observability metrics and the backtrack process during STPG.In this paper we propose new techniques to improve the controllability/observability metrics, and two forms of conflict-directed backtracking (back-jumping) to improve the backtrack process.Experimental results demonstrate that the proposed techniques are very promising and result in a significant improvement in fault efficiencies and CPU usage for the ISCAS'89 and industrial circuits.
Index Terms:
ATPG, sequential circuit TPG, cost estimates, back-jumping, conflict-directed backtrack, three-state (tri-state) circuit TPG
Citation:
Mario Konijnenburg, Hans Van der Linden, Ad van de Goor, "Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation," ats, pp.185, Eighth Asian Test Symposium (ATS'99), 1999
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