Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset

Shanghai, China November 16-November 18

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http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810762

Eighth Asian Test Symposium (ATS'99)

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	Teruhiko Yamada, Toshinori Kotake, Hiroshi Takahashi, Koji Yamazaki, "Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset," Asian Test Symposium, pp. 269, Eighth Asian Test Symposium (ATS'99), 1999.

	BibTex	x
	@article{ 10.1109/ATS.1999.810762, author = {Teruhiko Yamada and Toshinori Kotake and Hiroshi Takahashi and Koji Yamazaki}, title = {Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset}, journal ={Asian Test Symposium}, volume = {0}, year = {1999}, issn = {1081-7735}, pages = {269}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810762}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset SN - 1081-7735 SP EP A1 - Teruhiko Yamada, A1 - Toshinori Kotake, A1 - Hiroshi Takahashi, A1 - Koji Yamazaki, PY - 1999 KW - sequential PLA KW - redundant fault KW - seqnetial test KW - redundancy identification KW - design for testability VL - 0 JA - Asian Test Symposium ER -

Teruhiko Yamada, Meiji University

Toshinori Kotake, Meiji University

Hiroshi Takahashi, Meiji University

Koji Yamazaki, Meiji University

We present a technique for identifying redundant crosspoint faults in sequential PLAs with fault-free hardware reset. This technique can find most redundant crosspoint faults efficiently. Experimental results show that about 7% of crosspoint fauls are redundant on an average in the sequential PLAs synthesized by a commercial design tool SYNARIO for MCNC LGSynth89 finite-state machine benchmarks.

Index Terms:

sequential PLA, redundant fault, seqnetial test, redundancy identification, design for testability

Citation:

Teruhiko Yamada, Toshinori Kotake, Hiroshi Takahashi, Koji Yamazaki, "Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset," ats, pp.269, Eighth Asian Test Symposium (ATS'99), 1999

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