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Non-exhaustive Parity Testing
Kyoto, Japan November 19-November 21
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2001.99033510th Asian Test Symposium (ATS'01)
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Shiyi Xu, "Non-exhaustive Parity Testing," Asian Test Symposium, pp. 468, 10th Asian Test Symposium (ATS'01), 2001.
 
 
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@article{ 10.1109/ATS.2001.990335,
author = {Shiyi Xu},
title = {Non-exhaustive Parity Testing},
journal ={Asian Test Symposium},
volume = {0},
year = {2001},
isbn = {0-7695-1378-6},
pages = {468},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990335},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Asian Test Symposium
TI - Non-exhaustive Parity Testing
SN - 0-7695-1378-6
SP
EP
A1 - Shiyi Xu,
PY - 2001
VL - 0
JA - Asian Test Symposium
ER -
 
Shiyi Xu, Shanghai University
In this paper, some new approaches are presented to deal with the dilemma we are facing in using parity testing: (1)proposing a method of turning a parity untestable circuit into parity testable (2) presenting a scheme of replacing the exhaustive testing with non-exhaustive way. The parity testing may resume its spirits by using some new technologies including the way presented here.
Citation:
Shiyi Xu, "Non-exhaustive Parity Testing," ats, pp.468, 10th Asian Test Symposium (ATS'01), 2001
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