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Recent Advances in Test Planning for Modular Testing of Core-Based SOCs
Guam, USA November 18-November 20
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2002.118173111th Asian Test Symposium (ATS'02)
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Vikram Iyengar, IBM Microelectronics
Krishnendu Chakrabarty, Duke University
Erik Jan Marinissen, Philips Research Laboratories
Test planning for core-based system-on-a-chip (SOC) designs necessary to reduce testing time and test cost. In this paper, we sur-vey recent advances in test planning that address the problems of access and constrained test scheduling for core-based SOCs. We describe several test access architectures proposed by research groups in industry and academia, as well as a wide range of methodologies for the optimization of such architectures. An extensive list of references to prior and current work in the SOC test planning domain included.
Citation:
Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen, "Recent Advances in Test Planning for Modular Testing of Core-Based SOCs," ats, pp.320, 11th Asian Test Symposium (ATS'02), 2002
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