Mike W. T. Wong,
"Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis,"
Asian Test Symposium, pp. 120, 12th Asian Test Symposium (ATS'03), 2003.
BibTex
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@article{
10.1109/ATS.2003.1250795, author = {Mike W. T. Wong}, title = {Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis}, journal ={Asian Test Symposium}, volume = {0}, year = {2003}, issn = {1081-7735}, pages = {120}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250795}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Asian Test Symposium TI - Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis SN - 1081-7735 SP EP A1 - Mike W. T. Wong, PY - 2003 KW - null VL - 0 JA - Asian Test Symposium ER -
This paper identifies a few important points at which the application of equivalent fault analysis becomes the preferred choice in formulating DFT solution for analog circuit test.
Citation:
Mike W. T. Wong, "Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis," ats, pp.120, 12th Asian Test Symposium (ATS'03), 2003
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