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Test Response Compression Based on Huffman Coding
Xi?an, China November 16-November 19
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2003.125085412th Asian Test Symposium (ATS'03)
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Hideyuki Ichihara, Hiroshima City University
Michihiro Shintani, Hiroshima City University
Toshihiro Ohara, Hiroshima City University
Tomoo Inoue, Hiroshima City University
Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a response compression method based on Huffman coding. The proposed method guarantees zero-aliasing because faulty responses are mapped into code words, not just fault-free ones. Moreover the method is independent of the fault model and the structure of a circuit-under-test, and uses only the knowledge of the fault-free responses corresponding to a given test input set. Experimental results of the compression ratio and the size of the encoder for the proposed method are presented.
Citation:
Hideyuki Ichihara, Michihiro Shintani, Toshihiro Ohara, Tomoo Inoue, "Test Response Compression Based on Huffman Coding," ats, pp.446, 12th Asian Test Symposium (ATS'03), 2003
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