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Multi-Frequency Test Access Mechanism Design for Modular SOC Testing
Kenting, Taiwan November 15-November 17
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2004.6013th Asian Test Symposium (ATS'04)
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Qiang Xu, Nicola Nicolici, "Multi-Frequency Test Access Mechanism Design for Modular SOC Testing," Asian Test Symposium, pp. 2-7, 13th Asian Test Symposium (ATS'04), 2004.
 
 
BibTex
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@article{ 10.1109/ATS.2004.60,
author = {Qiang Xu and Nicola Nicolici},
title = {Multi-Frequency Test Access Mechanism Design for Modular SOC Testing},
journal ={Asian Test Symposium},
volume = {0},
year = {2004},
issn = {1081-7735},
pages = {2-7},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2004.60},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Multi-Frequency Test Access Mechanism Design for Modular SOC Testing
SN - 1081-7735
SP2
EP7
A1 - Qiang Xu,
A1 - Nicola Nicolici,
PY - 2004
KW - SOC testing
KW - Multi-frequency Virtual TAM
VL - 0
JA - Asian Test Symposium
ER -
 
Qiang Xu, McMaster University
Nicola Nicolici, McMaster University
This paper investigates the applicability of multi-frequency test access mechanism (TAM) design for reducing the system-on-a-chip (SOC) test application time. Based on the bandwidth matching concept the proposed algorithms explore a larger solution space, which, as shown by experimental data, can lead to improved test application time.
Index Terms:
SOC testing, Multi-frequency Virtual TAM
Citation:
Qiang Xu, Nicola Nicolici, "Multi-Frequency Test Access Mechanism Design for Modular SOC Testing," ats, pp.2-7, 13th Asian Test Symposium (ATS'04), 2004
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