Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction

Kenting, Taiwan November 15-November 17

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http://doi.ieeecomputersociety.org/10.1109/ATS.2004.80

13th Asian Test Symposium (ATS'04)

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	Yoshinobu Higami, Seiji Kajihara, Sin-ya Kobayashi, Yuzo Takamatsu, "Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction," Asian Test Symposium, pp. 46-49, 13th Asian Test Symposium (ATS'04), 2004.

	BibTex	x
	@article{ 10.1109/ATS.2004.80, author = {Yoshinobu Higami and Seiji Kajihara and Sin-ya Kobayashi and Yuzo Takamatsu}, title = {Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction}, journal ={Asian Test Symposium}, volume = {0}, year = {2004}, issn = {1081-7735}, pages = {46-49}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2004.80}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction SN - 1081-7735 SP46 EP49 A1 - Yoshinobu Higami, A1 - Seiji Kajihara, A1 - Sin-ya Kobayashi, A1 - Yuzo Takamatsu, PY - 2004 KW - null VL - 0 JA - Asian Test Symposium ER -

Yoshinobu Higami, Ehime University

Seiji Kajihara, Kyusyu Institute of Technology

Sin-ya Kobayashi, Ehime University

Yuzo Takamatsu, Ehime University

In this paper, we propose new techniques for finding Xs in test sequences for sequential circuits. Also we show two applications that utilize the obtained test sequences with Xs: reduction of the power during test and test compaction.

Citation:

Yoshinobu Higami, Seiji Kajihara, Sin-ya Kobayashi, Yuzo Takamatsu, "Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction," ats, pp.46-49, 13th Asian Test Symposium (ATS'04), 2004

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