I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment

Kenting, Taiwan November 15-November 17

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http://doi.ieeecomputersociety.org/10.1109/ATS.2004.50

13th Asian Test Symposium (ATS'04)

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	Masaki Hashizume, Daisuke Yoneda, Hiroyuki Yotsuyanagi, Tetsuo Tada, Takeshi Koyama, Ikuro Morita, Takeomi Tamesada, "I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment," Asian Test Symposium, pp. 112-117, 13th Asian Test Symposium (ATS'04), 2004.

	BibTex	x
	@article{ 10.1109/ATS.2004.50, author = {Masaki Hashizume and Daisuke Yoneda and Hiroyuki Yotsuyanagi and Tetsuo Tada and Takeshi Koyama and Ikuro Morita and Takeomi Tamesada}, title = {I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment}, journal ={Asian Test Symposium}, volume = {0}, year = {2004}, issn = {1081-7735}, pages = {112-117}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2004.50}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment SN - 1081-7735 SP112 EP117 A1 - Masaki Hashizume, A1 - Daisuke Yoneda, A1 - Hiroyuki Yotsuyanagi, A1 - Tetsuo Tada, A1 - Takeshi Koyama, A1 - Ikuro Morita, A1 - Takeomi Tamesada, PY - 2004 KW - null VL - 0 JA - Asian Test Symposium ER -

Masaki Hashizume, University of Tokushima

Daisuke Yoneda, University of Tokushima

Hiroyuki Yotsuyanagi, University of Tokushima

Tetsuo Tada, Tokushima Bunri University

Takeshi Koyama, Tokushima Bunri University

Ikuro Morita, University of Tokushima

Takeomi Tamesada, University of Tokushima

An I_DDQ test method is proposed in this paper, which is applicable even if supply current measurement is impaired by noise. Wavelet transformation is used for noise elimination in the test method. In this paper, it is shown by some experiments that bridging faults will be detected by using the proposed test method. Since expert knowledge on filter design is not needed in noise elimination of the I_DDQ test method, it is expected that the test method will be used in many I_DDQ tests.

Citation:

Masaki Hashizume, Daisuke Yoneda, Hiroyuki Yotsuyanagi, Tetsuo Tada, Takeshi Koyama, Ikuro Morita, Takeomi Tamesada, "I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment," ats, pp.112-117, 13th Asian Test Symposium (ATS'04), 2004

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