Modeling and Testing Crosstalk Faults in Inter-Core Interconnects that Include Tri-State and Bi-Directional Nets

Kenting, Taiwan November 15-November 17

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http://doi.ieeecomputersociety.org/10.1109/ATS.2004.59

13th Asian Test Symposium (ATS'04)

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	Wichian Sirisaengtaksin, Sandeep K. Gupta, "Modeling and Testing Crosstalk Faults in Inter-Core Interconnects that Include Tri-State and Bi-Directional Nets," Asian Test Symposium, pp. 132-139, 13th Asian Test Symposium (ATS'04), 2004.

	BibTex	x
	@article{ 10.1109/ATS.2004.59, author = {Wichian Sirisaengtaksin and Sandeep K. Gupta}, title = {Modeling and Testing Crosstalk Faults in Inter-Core Interconnects that Include Tri-State and Bi-Directional Nets}, journal ={Asian Test Symposium}, volume = {0}, year = {2004}, issn = {1081-7735}, pages = {132-139}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2004.59}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Modeling and Testing Crosstalk Faults in Inter-Core Interconnects that Include Tri-State and Bi-Directional Nets SN - 1081-7735 SP132 EP139 A1 - Wichian Sirisaengtaksin, A1 - Sandeep K. Gupta, PY - 2004 KW - null VL - 0 JA - Asian Test Symposium ER -

Wichian Sirisaengtaksin, University of Southern California

Sandeep K. Gupta, University of Southern California

In this paper, we carry out a systematic simulation study of crosstalk effects in inter-core interconnects that include tri-state and bi-directional nets and have arbitrary topologies. These studies allow us to develop a new crosstalk fault model for such interconnects. We also develop a framework to generate compact tests for such interconnects. We present experimental results that show that the proposed approach provides high fault coverage using a small number of tests.

Citation:

Wichian Sirisaengtaksin, Sandeep K. Gupta, "Modeling and Testing Crosstalk Faults in Inter-Core Interconnects that Include Tri-State and Bi-Directional Nets," ats, pp.132-139, 13th Asian Test Symposium (ATS'04), 2004

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