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Classification of Sequential Circuits Based on τk Notation
Kenting, Taiwan November 15-November 17
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2004.3113th Asian Test Symposium (ATS'04)
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Chia Yee Ooi, Nara Institute of Science and Technology
Hideo Fujiwara, Nara Institute of Science and Technology
In this paper, we introduce a new test generation complexity notation called τ^k notation, which consists of τ^k-equivalent and τ^k-bounded, in order to clarify the classification of sequential circuits based on combinational test generation complexity. We reconsider the test generation complexity for the existing classes of acyclic sequential circuits. Several new classes of sequential circuits that cover some cyclic sequential circuits have been identified as being τ-equivalent and τ-bounded.
Citation:
Chia Yee Ooi, Hideo Fujiwara, "Classification of Sequential Circuits Based on τk Notation," ats, pp.348-353, 13th Asian Test Symposium (ATS'04), 2004
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