C. Hagwood, R. Kacker, J. Yen, D. Banks, L. Rosenthal, L. Gallagher, P. Black,
"Reliability of Conformance Tests,"
Computer Software and Applications Conference, Annual International, pp. 368, 22nd International Computer Software and Application Conference, 1998.
BibTex
x
@article{
10.1109/CMPSAC.1998.716682, author = {C. Hagwood and R. Kacker and J. Yen and D. Banks and L. Rosenthal and L. Gallagher and P. Black}, title = {Reliability of Conformance Tests}, journal ={Computer Software and Applications Conference, Annual International}, volume = {0}, year = {1998}, issn = {0730-3157}, pages = {368}, doi = {http://doi.ieeecomputersociety.org/10.1109/CMPSAC.1998.716682}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Computer Software and Applications Conference, Annual International TI - Reliability of Conformance Tests SN - 0730-3157 SP EP A1 - C. Hagwood, A1 - R. Kacker, A1 - J. Yen, A1 - D. Banks, A1 - L. Rosenthal, A1 - L. Gallagher, A1 - P. Black, PY - 1998 VL - 0 JA - Computer Software and Applications Conference, Annual International ER -
C. Hagwood, R. Kacker, J. Yen, D. Banks, L. Rosenthal, L. Gallagher, P. Black, "Reliability of Conformance Tests," compsac, pp.368, 22nd International Computer Software and Application Conference, 1998
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