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Precise Simultaneous Estimation of Image Deformation Parameters
Washington, D.C., USA June 27-July 02
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/CVPR.2004.4202004 Conference on Computer Vision an ...
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Masao Shimizu, Tokyo Institute of Technology, Japan
Takahiro Yano, Tokyo Institute of Technology, Japan
Masatoshi Okutomi, Tokyo Institute of Technology, Japan
This paper presents a new method to obtain simultaneously precise N parameters of image deformation with non-iterative calculation by extending area-based matching and sub-pixel estimation. Although area-based matching and similarity interpolation for sub-pixel displacement estimation are commonly used in many areas as a fundamental procedure, they are bound to simple translation.
The proposed method is based on a practical similarity model in N-dimensional parameter space. Using similarity measures obtained at discrete positions in the parameter space, our method provides a highly accurate maximum position of similarity in sub-sampling resolution; that position corresponds to image deformation parameters. Experimental results using both synthetic and real images demonstrate that our method can estimate parameters more accurately than previous methods.
Citation:
Masao Shimizu, Takahiro Yano, Masatoshi Okutomi, "Precise Simultaneous Estimation of Image Deformation Parameters," cvprw, vol. 11, pp.175, 2004 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'04) Volume 11, 2004
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