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Higher Product Complexity and Shorter Development Time - Continuous Challenge to Design and Test Environment
Munich, Germany March 09-March 12
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.1999.761087Design, Automation and Test in Europe ...
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Jouko Junkkari, "Higher Product Complexity and Shorter Development Time - Continuous Challenge to Design and Test Environment," Design, Automation and Test in Europe Conference and Exhibition, pp. 2, Design, Automation and Test in Europe (DATE '99), 1999.
 
 
BibTex
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@article{ 10.1109/DATE.1999.761087,
author = {Jouko Junkkari},
title = {Higher Product Complexity and Shorter Development Time - Continuous Challenge to Design and Test Environment},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {0},
year = {1999},
issn = {1530-1591},
pages = {2},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.1999.761087},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Higher Product Complexity and Shorter Development Time - Continuous Challenge to Design and Test Environment
SN - 1530-1591
SP
EP
A1 - Jouko Junkkari,
PY - 1999
VL - 0
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Jouko Junkkari, Nokia Mobile Phones
Digital technologies enable more functionality and new attractive products at faster pace. What are the challenges faced in the development? How must the processes change? How must the tools change? How must the businesses change? What are the strategic questions to be answered?
Citation:
Jouko Junkkari, "Higher Product Complexity and Shorter Development Time - Continuous Challenge to Design and Test Environment," date, pp.2, Design, Automation and Test in Europe (DATE '99), 1999
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