loading...
Glitch Power Minimization by Gate Freezing
Munich, Germany March 09-March 12
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.1999.761113Design, Automation and Test in Europe ...
 This Article 
 
PDF
HTML
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
L. Benini, Universit? di Bologna
G. de Micheli, Stanford University
A. Macii, Politecnico di Torino
E. Macii, Politecnico di Torino
M. Poncino, Politecnico di Torino
R. Scarsi, Politecnico di Torino
This paper presents a technique for glitch power minimization in combinational circuits. The total number of glitches is reduced by replacing some existing gates with functionally equivalent ones (called F-Gates) that can be frozen by asserting a control signal. A frozen gate cannot propagate glitches to its output. An important feature of the proposed method is that it can be applied in-place directly to layout-level descriptions; therefore, it guarantees very predictable results and minimizes the impact of the transformation on circuit size and speed.
Citation:
L. Benini, G. de Micheli, A. Macii, E. Macii, M. Poncino, R. Scarsi, "Glitch Power Minimization by Gate Freezing," date, pp.163, Design, Automation and Test in Europe (DATE '99), 1999
Usage of this product signifies your acceptance of the Terms of Use.