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Analysis and Minimization of Test Time in a Combined BIST and External Test Approach
Paris, France March 27-March 30
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2000.840029Design, Automation and Test in Europe ...
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Makoto Sugihara, Hiroto Yasuura, Hiroshi Date, "Analysis and Minimization of Test Time in a Combined BIST and External Test Approach," Design, Automation and Test in Europe Conference and Exhibition, pp. 134, Design, Automation and Test in Europe (DATE '00), 2000.
 
 
BibTex
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@article{ 10.1109/DATE.2000.840029,
author = {Makoto Sugihara and Hiroto Yasuura and Hiroshi Date},
title = {Analysis and Minimization of Test Time in a Combined BIST and External Test Approach},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {0},
year = {2000},
issn = {1530-1591},
pages = {134},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2000.840029},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Analysis and Minimization of Test Time in a Combined BIST and External Test Approach
SN - 1530-1591
SP
EP
A1 - Makoto Sugihara,
A1 - Hiroto Yasuura,
A1 - Hiroshi Date,
PY - 2000
VL - 0
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Makoto Sugihara, Kyushu University
Hiroto Yasuura, Kyushu University
Hiroshi Date, Institute of Systems &Information Technologies
In this paper, an analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test approach can achieve shorter testing time than both external test and BIST in many situations. An efficient test time minimization algorithm for CBET-based LSIs is also proposed. It uses several characteristics of CBET test approach derived by the analysis to reduce computation time to find the optimum test sets. The algorithm helps designers to save their precious design time.
Citation:
Makoto Sugihara, Hiroto Yasuura, Hiroshi Date, "Analysis and Minimization of Test Time in a Combined BIST and External Test Approach," date, pp.134, Design, Automation and Test in Europe (DATE '00), 2000
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