Power in processing cores (microprocessors, DSPs) is primarily consumed in the datapath part. Among the datapath functional modules, multipliers consume the largest amount of power due to their size and complexity. We propose a low power BIST scheme for data-paths built around multiplier-accumulator pairs. The target is low average power dissipation between successive test vectors. This is achieved by taking advantage of the regularity of multiplier modules and achieving very high fault coverage by a linear-sized test set with as small as possible input switching activity. The proposed BIST scheme is more efficient than pseudorandom BIST for the same high fault coverage target. Up to 77.25% power saving is achieved in the set of experimental results provided in the paper.