Carsten Wegener, Michael Peter Kennedy,
"Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs,"
Design, Automation and Test in Europe Conference and Exhibition, pp. 765, Design, Automation and Test in Europe (DATE '00), 2000.
BibTex
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@article{
10.1109/DATE.2000.840898, author = {Carsten Wegener and Michael Peter Kennedy}, title = {Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {0}, year = {2000}, issn = {1530-1591}, pages = {765}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2000.840898}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs SN - 1530-1591 SP EP A1 - Carsten Wegener, A1 - Michael Peter Kennedy, PY - 2000 KW - Defect and Tolerance-Oriented Test KW - ATPG and Fault Modeling KW - Analog and Mixed-Signal Test VL - 0 JA - Design, Automation and Test in Europe Conference and Exhibition ER -
Defect and Tolerance-Oriented Test, ATPG and Fault Modeling, Analog and Mixed-Signal Test
Citation:
Carsten Wegener, Michael Peter Kennedy, "Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs," date, pp.765, Design, Automation and Test in Europe (DATE '00), 2000
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