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On Modeling Cross-Talk Faults
Munich, Germany March 03-March 07
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10009Design, Automation and Test in Europe ...
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Sujit T Zachariah, Yi-Shing Chang, Sandip Kundu, Chandra Tirumurti, "On Modeling Cross-Talk Faults," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 10490, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003.
 
 
BibTex
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@article{ 10.1109/DATE.2003.10009,
author = {Sujit T Zachariah and Yi-Shing Chang and Sandip Kundu and Chandra Tirumurti},
title = {On Modeling Cross-Talk Faults},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {1},
year = {2003},
issn = {1530-1591},
pages = {10490},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10009},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - On Modeling Cross-Talk Faults
SN - 1530-1591
SP
EP
A1 - Sujit T Zachariah,
A1 - Yi-Shing Chang,
A1 - Sandip Kundu,
A1 - Chandra Tirumurti,
PY - 2003
KW - null
VL - 1
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Sujit T Zachariah, Intel Corporation
Yi-Shing Chang, Intel Corporation
Sandip Kundu, Intel Corporation
Chandra Tirumurti, Intel Corporation
Circuit marginality failures in high performance VLSI circuits are projected to increase due to shrinking process geometries and high frequency design techniques. Capacitive cross coupling between interconnects is known to be a prime contributor to such failures. In this paper, we present novel techniques to model and prioritize capacitive cross-talk faults. Experimental results are provided to show effectiveness of the proposed modeling technique on industrial circuits.
Citation:
Sujit T Zachariah, Yi-Shing Chang, Sandip Kundu, Chandra Tirumurti, "On Modeling Cross-Talk Faults," date, vol. 1, pp.10490, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003
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