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From Synchronous to Asynchronous: An Automatic Approach
Paris, France February 16-February 20
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2004.1269092Design, Automation and Test in Europe ...
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J. Cortadella, A. Kondratyev, L. Lavagno, K. Lwin, C. Sotiriou, "From Synchronous to Asynchronous: An Automatic Approach," Design, Automation and Test in Europe Conference and Exhibition, vol. 2, pp. 21368, Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04), 2004.
 
 
BibTex
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@article{ 10.1109/DATE.2004.1269092,
author = {J. Cortadella and A. Kondratyev and L. Lavagno and K. Lwin and C. Sotiriou},
title = {From Synchronous to Asynchronous: An Automatic Approach},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {2},
year = {2004},
issn = {1530-1591},
pages = {21368},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2004.1269092},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - From Synchronous to Asynchronous: An Automatic Approach
SN - 1530-1591
SP
EP
A1 - J. Cortadella,
A1 - A. Kondratyev,
A1 - L. Lavagno,
A1 - K. Lwin,
A1 - C. Sotiriou,
PY - 2004
KW - null
VL - 2
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
J. Cortadella, University Politècnica de Catalunya
A. Kondratyev, Cadence Berkeley Labs
L. Lavagno, Politecnico di Torino
K. Lwin, Cadence Berkeley Labs
C. Sotiriou, ICS-FORTH
This paper presents a methodology to derive asynchronous circuits from optimized synchronous circuits by replacing the clock distribution tree by a handshaking network. A case study shows the applicability of the method and the potential benefits of de-synchronizing synchronous circuits.
Citation:
J. Cortadella, A. Kondratyev, L. Lavagno, K. Lwin, C. Sotiriou, "From Synchronous to Asynchronous: An Automatic Approach," date, vol. 2, pp.21368, Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04), 2004
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