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Enhancing Testability of System on Chips Using Network Management Protocols
Paris, France February 16-February 20
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2004.1269093Design, Automation and Test in Europe ...
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O. Laouamri, C. Aktouf, "Enhancing Testability of System on Chips Using Network Management Protocols," Design, Automation and Test in Europe Conference and Exhibition, vol. 2, pp. 21370, Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04), 2004.
 
 
BibTex
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@article{ 10.1109/DATE.2004.1269093,
author = {O. Laouamri and C. Aktouf},
title = {Enhancing Testability of System on Chips Using Network Management Protocols},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {2},
year = {2004},
issn = {1530-1591},
pages = {21370},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2004.1269093},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Enhancing Testability of System on Chips Using Network Management Protocols
SN - 1530-1591
SP
EP
A1 - O. Laouamri,
A1 - C. Aktouf,
PY - 2004
KW - null
VL - 2
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
O. Laouamri, LCIS - INPG
C. Aktouf, LCIS - INPG
This paper shows how to adapt the P1500 Design-For-Test standard through network management protocols to make the testing problem of System-On-Chips (SoCs) easier and cost-effective. For this purpose, a SoC is analyzed as a distributed system in which its own basic components or IP Cores (Intellectual Proprieties) are considered as network agents according to SNMP (Simple Network Management Protocol) protocol. An experimental study was carried out to show the effectiveness of such an approach.
Citation:
O. Laouamri, C. Aktouf, "Enhancing Testability of System on Chips Using Network Management Protocols," date, vol. 2, pp.21370, Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04), 2004
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